Minutes, IBIS Quality Committee

16 February 2010

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
* Bruce Archambeault, IBM
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.
- The usual beginning formalities were skipped

New items:

Bruce Archambeault gave a presentation on "Feature Selective Validation (FSV)
  For Comparison and Validation of Data Sets"
- Anders: On slide 21 the last and fourth from last items have the same
  characterization "very low to very high"

Lance: On slide 9 what does the 0.1 value represent?
- Bruce: The values are from a Fourier transform
  - The low frequency half is the ADM
  - The high frequency half is the FDM
- Lance: On slide 21, low numbers are good

Mike: The frequency plots could show the threshold lines
  - Areas under the curve could be shaded by threshold crossing
- Bruce: It may be possible to get the Matlab code that created these
  - Alistair Duffy in the UK invented FSV
  - He and Antonio Orlandi may be of help

Bob: How are the threshold values determined?
- Bruce: To some degree they mimic human judgment

Bob: How is the dividing line between ADM and FDM frequency determined?
- Bruce: There is usually an obvious (to humans) change
  - Simulation timestep affects top frequency, which changes the scale
  - If the timestep is smaller than necessary there will be no energy at
    the high frequency end

Bob: Is this compatible with non-uniform time points?
- Bruce: That may throw off the software

Anders: The reference and test data must be properly time shifted too
- Mike: One technique is to pre-shift for minimum difference area

Bob: Is this an approved IEEE standard?
- Bruce: Yes, IEEE 1597.1 is published
  - Draft versions were sent due to copyright restrictions
  - A best practices document IEEE 1597.2 may be approved soon
  - They might like to have examples of IBIS FSV use for their website

Bruce: FSV can also be used in 2D
- For example, for image processing

Bob: The description of FSV here differs from we have seen before
- David Banas and Roy Leventhal describe measuring specific features
- Mike: It was similar to JEDEC slew rate measurements, for example
  - But using a Fourier transform gives an overview of the entire waveform

Bruce: It may be good to use phase as well as magnitude
- Tools should be able to look at both
- Mike: That makes sense since we are often measuring timing

Moshiul: Measured data may be between fast and slow, but not on any corner
- Mike: FSV seems appropriate as an overlay metric
  - Usually an envelope metric is applied to bench measurements
- Bob: Sometimes measurements can be scaled to fit

AR: Mike post Bruce Archambeault presentation on website

Next meeting will be Feb 23

Meeting ended at 12:20 PM Eastern Time.
